TY  - BOOK
AU  - Bardeleben,H.J.von
ED  - International conference on defects in semiconductors.
TI  - Defects in semiconductors: proceedings 
T2  - Materials Science Forum / editor-in-chief G. E. Murch
SN  - 0878495517
PY  - 1986///
CY  - Aedermannsdorf : 
PB  - Trans Tech Publications, 
N1  - Bibliografija uz radove
ER  -