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Anomalous x ray scattering for materials characterization : atomic scale structure determination / Yoshio Waseda.

By: Material type: TextTextSeries: Springer tracts in modern physics, ISSN 0081-3869 ; 179Publication details: Berlin [etc.] : Springer, cop. 2002.Description: XIII, 214 str. : ilustr. ; 24 cmISBN:
  • 3540434437
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Item type Current library Collection Call number Copy number Status Date due Barcode
Knjiga Knjiga Knjižnica Instituta Ruđer Bošković 1. krilo Zbirka znanstvene literature 02.11/79/179/D1 (Browse shelf(Opens below)) 32627 Checked out 2042-10-10 0981003814
Knjiga Knjiga Knjižnica Instituta Ruđer Bošković 1. krilo Zbirka znanstvene literature 02.11/79/179 (Browse shelf(Opens below)) 34242 Available 0981003717

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