High resolution x- ray scattering from thin films and multilayers / Vaclav Holy, Ulrich Pietsch, Tilo Baumbach.
Material type:
- 354062029X
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
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Knjižnica Instituta Ruđer Bošković 1. krilo | Zbirka znanstvene literature | 02.11/79/149 (Browse shelf(Opens below)) | 31482 | Available | 0981002760 |
Bibliografija.
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