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High resolution x- ray scattering from thin films and multilayers / Vaclav Holy, Ulrich Pietsch, Tilo Baumbach.

By: Contributor(s): Material type: TextTextSeries: Springer tracts in modern physics ; 149Publication details: Berlin [etc.] : Springer, 1999.Description: XI, 256 str. : ilustr. ; 25 cmISBN:
  • 354062029X
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Item type Current library Collection Call number Copy number Status Date due Barcode
Knjiga Knjiga Knjižnica Instituta Ruđer Bošković 1. krilo Zbirka znanstvene literature 02.11/79/149 (Browse shelf(Opens below)) 31482 Available 0981002760

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