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Defects in semiconductors 16, part 3:

Additional authors: edt -- Davies, Gordon | edt -- DeLeo, Gary G. | edt -- Stavola, Michael
Series: Materials science forum ; . vol.83-87 0255-5476 Published by : Trans tech, (Zuerich :) , 1992 Physical details: 1081-1604 str. : ilustr. ; 25 cm. ISBN:9780878496280; 80878496289. ISSN:0255-5476
Subject(s): defects in SiC and diamond -- hetero-epitaxy and strained layers -- superlattices -- processing-induced defects -- effects of defects on devices
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