Waseda, Yoshio

Anomalous x ray scattering for materials characterization : atomic scale structure determination / Yoshio Waseda. - Berlin [etc.] : Springer, cop. 2002. - XIII, 214 str. : ilustr. ; 24 cm. - (Springer tracts in modern physics, ISSN 0081-3869 ; ; 179)

Bibliografija.

3540434437

solid state physics -- x ray scattering -- materials characterization --

539.2

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